Production Test Socket
The test socket and probe card solutions fromSmiths Interconnectutilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications.
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Coaxial solution with controlled impedance for high-speed testing
High Speed Test - DaVinci 112
The DaVinci 112 Test Socket extends the 'DaVinci' series with an innovative solution for testing the most complex functionality of ASICs (application-specific integrated circuits).
Coaxial solution with controlled impedance for high-speed testing
High Speed Test - DaVinci Micro
The rapid expansion of connected devices and data-intensive applications is driving the growing demand for high-performance computing solutions that are both efficient and adaptive.
Sockets for high-speed testing
High Speed Test - DaVinci
Integrated circuit (IC) developers are increasingly integrating more features into a single package, thereby increasing the complexity of testing. High-speed digital and analog devices are being manufactured at record volumes, and the need for high-performance testing has never been greater.
Standard test socket
Standard & Peripheral Test
Custom test sockets for all types of integrated circuit (IC) packages. Suitable for laboratory test applications, engineering, system level test (SLT), and automated test equipment (ATE). Wide selection of Smiths Interconnect spring pins offering low and stable contact resistance. World-class design, laboratory, and manufacturing facilities to ensure consistent product performance and maximum customer satisfaction. Very competitive pricing and global support.
Probe Head for WLCSP
Volta Series Probe Head WLCSP
The Volta Probe Head series addresses the need to reduce test setup time and increase throughput in high-reliability testing of wafer-level packages (WLP), wafer-level chip-scale packages (WLCSP), and known good die (KGD) with a pitch of 180 µm and above.
Broadband test socket for integrated circuit testing
LEVAN: Conductive Elastomer Test Socket
The Levan family of elastomeric sockets is specifically designed with precision. The Levan elastomeric grid features conductive columns that ensure accurate and consistent test results for a range of devices.
GUTENBERG: Peripheral Strip Test
Gutenberg sockets meet the requirements of the most advanced strip test applications. They are designed for reliability of millions of cycles and are particularly suited for aggressive common automatic cleaning technologies in strip test environments.
Celsius Test Sockets
CELSIUS: Peripheral Tri-Temp Test
Celsius test sockets feature friction contact technology, ideal for QFN testing.
High-precision test socket for simultaneous high/low testing
Euclid: Array PoP Test
Our highly precise test socket allows for simultaneous testing of the upper and lower arrays, thereby optimizing package-on-package (PoP) testing.
- Custom design: Suitable for testing high-speed signals in various environments, including laboratories, engineering, SLT (System-Level Test) and ATE (Automated Test Equipment).
- High-speed signal integrity: Controlled impedance feedback loop with integrated PCB, ensuring optimal high-frequency signal integrity.
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